B.  Fraunhofer and Fresnel diffraction

In general, if the observation screen is far removed from the slit on which plane waves fall (as in Figure 4-15) or a lens is used to focus the collimated light passing through the slit onto the screen (as in Figure 4-14), the diffraction occurring is described as Fraunhofer diffraction, after Joseph von Fraunhofer (1787-1826), who first investigated and explained this type of so-called far-field diffraction. If however, no lens is used and the observation screen is near to the slit, for either incident plane or spherical waves, the diffraction is called Fresnel diffraction, after Augustin Fresnel (1788-1829), who explained this type of near-field diffraction. The mathematical calculations required to determine the details of a diffraction pattern and account for the variations in intensity on the pattern are considerably more complicated for Fresnel diffraction than for Fraunhofer diffraction, so typically one studies first the Fraunhofer diffraction patterns, as we have.

Without going into the details of how to distinguish mathematically between Fresnel and Fraunhofer diffraction we can give results that help you decide whether the diffraction pattern formed is Fraunhofer or Fresnel in origin. Knowing this distinction helps you choose which equations to use in describing a particular diffraction pattern arising from a particular optical setup.

1.  Criteria for far-field and near-field diffraction. Figure 4-16 shows the essential features of a general diffraction geometry, involving a source of light of wavelength l, an opening to "obstruct" the light, and a screen to form the diffraction pattern.

Figure 4-16  General diffraction geometry involving source, aperture, and screen

The distance from source to aperture is denoted as Z and that from aperture to screen as Z¢. Calculations based on geometries that give rise to Fraunhofer and Fresnel diffraction patterns verify the following:

 

(4-22)

Figure 4-18 illustrates these conditions and shows the locations of the near field, far field, and a gray area in between. If the screen is in the gray area and accuracy is important, a Fresnel analysis is usually applied. If the screen is in the gray area and approximate results are acceptable, a Fraunhofer analysis (significantly simpler than a Fresnel analysis) can be applied.

Figure 4-17  Defining near-field and far-field regions for diffraction

Figure 4-18 shows how we can satisfy the conditions for Fraunhofer diffraction, as spelled out in Equation 4-22, through the use of focusing lenses on both sides of the aperture (Figure 4-18a)—or with a laser illuminating the aperture and a focusing lens located on the screen side of the aperture (Figure 4-18b). Either optical arrangement has plane waves approaching and leaving the aperture, guaranteeing that the diffraction patterns formed are truly Fraunhofer in nature.

Figure 4-18  Optical arrangements for Fraunhofer diffraction

Now let's see how Equation 4-22 and Figure 4-18 are applied in a real situation.

2.  Several typical Fraunhofer diffraction patterns.  In successive order, we show the far-field diffraction pattern for a single slit (Figure 4-19), a circular aperture (Figure 4-20), and a rectangular aperture (Figure 4-21). Equations that describe the locations of the bright and dark fringes in the patterns accompany each figure.

Single Slit

Half-angle beam spread to first minimum, q1/2, is:

  q1/2 =

(4-23)

Half-width of bright central fringe, y1, is:

 

y1 =

(4-24)


where l  = wavelength of light,
D  = slit width, and
Z¢  = slit-to-screen distance

Figure 4-19  Fraunhofer diffraction pattern for a single slit

 

Circular Aperture


Half-angle beam spread to first minimum, q1/2, is:

  q1/2 =

(4-25)

Radius of central bright disk (airy disk), R, is:

 

R =

(4-26)


where l  = wavelength of light,
D  = diameter of pinhole, and
Z¢  = aperture-to-screen distance

Figure 4-20  Fraunhofer diffraction pattern for a circular aperture

 

Rectangular aperture


Half-angle beam divergences to first minimum in x and y directions:

 

(4-27)

Half-widths of central bright fringe in x and y directions:

 

(4-28)

Figure 4-21  Fraunhofer diffraction pattern for a rectangular aperture